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唐峰, 万贤纲. 基于对称性指标预测拓扑材料[J]. 物理, 2019, 48(6): 341-356. DOI: 10.7693/wl20190601
引用本文: 唐峰, 万贤纲. 基于对称性指标预测拓扑材料[J]. 物理, 2019, 48(6): 341-356. DOI: 10.7693/wl20190601
TANG Feng, WAN Xian-Gang. Efficient topological materials discovery using symmetry indicators[J]. PHYSICS, 2019, 48(6): 341-356. DOI: 10.7693/wl20190601
Citation: TANG Feng, WAN Xian-Gang. Efficient topological materials discovery using symmetry indicators[J]. PHYSICS, 2019, 48(6): 341-356. DOI: 10.7693/wl20190601

基于对称性指标预测拓扑材料

Efficient topological materials discovery using symmetry indicators

  • 摘要: 拓扑材料是凝聚态物理和材料科学领域的前沿课题。随着理论方法的发展,最近人们在大规模筛选拓扑材料方向取得了多个进展。文章着重介绍作者基于对称性指标理论发展的根据在原子绝缘体基组展开系数高效判断材料拓扑性质的方法,以及相关的典型材料。人们预言的数千个新的拓扑体系为进一步深入研究拓扑材料提供了基础。

     

    Abstract: Over the past decade, topological materials——in which the topology of electron bands in the bulk material leads to robust, unconventional surface states and electromagnetism——have attracted much attention. With the development of the theoretical methods,recently there have been many advancements on searching for topological materials in a large scale. Very recently, based on symmetry-indicator theory and using so-called atomic insulator basis, we develop a theoretical method for systematically discovering topological materials. In this paper, we introduce our algorithm, and we also discuss several typical topological materials. The predicted thousands of topological materials provide a platform for further study on topological materials next step.

     

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