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郭方准. 解说低能量/光电子显微镜(LEEM/PEEM)[J]. 物理, 2010, 39(03): 211-218.
引用本文: 郭方准. 解说低能量/光电子显微镜(LEEM/PEEM)[J]. 物理, 2010, 39(03): 211-218.
Low energy/photoemission electron microscopy[J]. PHYSICS, 2010, 39(03): 211-218.
Citation: Low energy/photoemission electron microscopy[J]. PHYSICS, 2010, 39(03): 211-218.

解说低能量/光电子显微镜(LEEM/PEEM)

Low energy/photoemission electron microscopy

  • 摘要: 文章介绍近年来倍受关注的低能量/光电子显微镜(LEEM/PEEM)的基本原理和应用.LEEM/PEEM拥有成像、光电子能谱和衍射功能,可对样品进行综合全面的分析.通过一系列的应用实例,特别是和同步辐射软X射线结合的成果,展示该实验手段在表面科学和纳米技术方面的应用.

     

    Abstract: The rapidly developing field of low energy and photoemission electron microscopy (LEEM/PEEEM) is reviewed. This technology combines microscopy, spectroscopy and diffraction in one system, which allows a comprehensive characterization of the specimen under study. The combination of LEEM/PEEM and soft X-rays in a synchrotron radiation facility is especially powerful for studies in surface science and nano-technology.

     

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