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王荣明, 刘家龙, 宋源军. 原位透射电子显微学进展及应用[J]. 物理, 2015, 44(02): 96-105. DOI: 10.7693/wl20150205
引用本文: 王荣明, 刘家龙, 宋源军. 原位透射电子显微学进展及应用[J]. 物理, 2015, 44(02): 96-105. DOI: 10.7693/wl20150205
WANG Rong-Ming, LIU Jia-Long, SONG Yuan-Jun. Progress and applications of in situ transmission electron microscopy[J]. PHYSICS, 2015, 44(02): 96-105. DOI: 10.7693/wl20150205
Citation: WANG Rong-Ming, LIU Jia-Long, SONG Yuan-Jun. Progress and applications of in situ transmission electron microscopy[J]. PHYSICS, 2015, 44(02): 96-105. DOI: 10.7693/wl20150205

原位透射电子显微学进展及应用

Progress and applications of in situ transmission electron microscopy

  • 摘要: 文章简要介绍了近年来原位透射电子显微学的进展,并指出,原位透射电子显微技术的发展使得在纳米、原子层次观察样品在力、热、电、磁作用下以及化学反应过程中的微结构演化成为可能。通过研究物质在外界环境作用下的微结构演化规律,揭示其原子结构与物理化学性质的相关性,指导其设计合成和微结构调控,促进新物质的探索和深层次物质结构研究,为解决凝聚态物理学中的具体问题提供了直接、准确和详细的方法。

     

    Abstract: Recent progress in the application of in situ transmission electron microscopy (TEM) is briefly eviewed. It is emphasized that the development of advanced in situ TEM techniques makes it possible to investigate the volution of materials under heat, strain, magnetic field, electric field or chemical reaction nvironments on the atomic scale. The mechanism of the microstructure evolution under various conditions and the relationship between the atomic structures and their properties can be obtained, which is beneficial for the design of new materials with tailored properties. The clarification of the structure-property relationship will help to develop new materials and solve related basic problems in the field of condensed matter physics.

     

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